Projection exposure apparatus comprising a manipulator, and method for controlling a projection exposure apparatus
US9760019B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 21, 2016 |
| Grant date | Sep 12, 2017 |
| Priority date | — |
| Expiry date | Apr 1, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03F7/706
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method for controlling a microlithographic projection exposure apparatus includes: determining a wavefront error of the projection exposure apparatus; generating a travel vector, suitable for correcting the wavefront error, with travels for each zone of the optical manipulator; establishing a constraint parameter with respect to the travel for at least one zone of the optical manipulator; and checking the travels of the generated travel vector with respect to implementability.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.