Patent · US Active

Uniformity control circuit for use within an impedance matching circuit

US9761414B2 · kind B2 · utility

30Cited by
9References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 8, 2015
Grant dateSep 12, 2017
Priority date
Expiry dateOct 31, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/334
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An impedance matching circuit (IMC) is described. The IMC includes a first circuit that includes a first plurality of tuning elements defined along a path. The first circuit has an input coupled to a kilohertz (kHz) radio frequency (RF) generator. The first circuit is coupled to an output. The IMC further includes a second circuit having a second plurality of tuning elements. The second circuit has an input coupled to a megahertz (MHz) RF generator and is coupled to the output. The IMC includes a uniformity control circuit (UCC) defined from at least one of the plurality of tuning elements of the first circuit. The UCC is connected serially along the path of the first circuit to define a capacitance that at least partially influences a radial uniformity profile in an etch rate produced by a plasma chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.