Kenneth Lucchesi
12Patents
5h-index
9Co-inventors
51Inventor score
Filing activity: Oct 8, 2015 → Jul 22, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9852889B1 | Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring | Electricity | 105 | Active |
| US10115568B2 | Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring | Electricity | 47 | Active |
| US9761414B2 | Uniformity control circuit for use within an impedance matching circuit | Electricity | 30 | Active |
| US10283330B2 | Systems and methods for achieving a pre-determined factor associated with an edge region within a plasma chamber by synchronizing main and edge RF generators | Electricity | 5 | Active |
| US10615003B2 | Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring | Electricity | 5 | Active |
| US10002746B1 | Multi regime plasma wafer processing to increase directionality of ions | Electricity | 4 | Active |
| US11195706B2 | Systems and methods for achieving a pre-determined factor associated with an edge region within a plasma chamber by synchronizing main and edge RF generators | Electricity | 3 | Active |
| US10115564B2 | Uniformity control circuit for use within an impedance matching circuit | Electricity | 2 | Active |
| US10304662B2 | Multi regime plasma wafer processing to increase directionality of ions | Electricity | 2 | Active |
| US10916409B2 | Active control of radial etch uniformity | Electricity | 0 | Active |
| US10825656B2 | Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring | Electricity | 0 | Active |
| US11935730B2 | Systems and methods for cleaning an edge ring pocket | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.