Patent · US Active

LBIST debug controller

US9766289B2 · kind B2 · utility

5Cited by
5References
7Claims
0Family size

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Inventors

Key dates

Filing dateOct 6, 2015
Grant dateSep 19, 2017
Priority date—
Expiry dateMar 4, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318547
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An integrated circuit (IC) includes a logic built-in self-test (LBIST) system that includes scan chains. The scan chains receive a clock signal and test pattern signals, and generate scan out signals. A debug controller receives the scan out signals and shifts a set of the scan out signals to a joint test action group (JTAG) controller. The debug controller also maintains a dynamic count indicative of the number of debug shift operations performed, and compares the dynamic count with a final count. If the dynamic count is less than the final count, the debug controller performs a second debug shift operation, which facilitates determination of a fault location in the IC.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.