Sagar Kataria
3Patents
2h-index
5Co-inventors
30Inventor score
Filing activity: Jul 25, 2014 → Oct 6, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9568551B1 | Scan wrapper circuit for integrated circuit | Physics | 7 | Active |
| US9766289B2 | LBIST debug controller | Physics | 5 | Active |
| US9201116B1 | Method of generating test patterns for detecting small delay defects | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.