Calibrating the positions of a rotating and translating two-dimensional scanner
US9784563B2 · kind B2 · utility
2Cited by
1References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 3, 2010 |
| Grant date | Oct 10, 2017 |
| Priority date | — |
| Expiry date | Sep 3, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N35/00584
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods are provided that comprise calibration techniques and associated systems that identify the two-dimensional position, or other alignment or positioning, of sample wells or other calibration objects located in a sample well plate, or other surface or area of interest. In some embodiments, calibration of the plate and/or positioning and/or alignment with respect to detection optics can be performed in multiple stages for two or more dimensions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.