Inventor · Zapopan, MX

David Woo

18Patents
3h-index
36Co-inventors
56Inventor score

Filing activity: May 20, 2002 → Jun 11, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US7228237B2 Automatic threshold setting and baseline determination for real-time PCR Physics 24 Expired
US7839507B2 Minimizing effects of dye crosstalk Physics 7 Active
US7398171B2 Automated quality control method and system for genetic analysis Physics 5 Active
US9784563B2 Calibrating the positions of a rotating and translating two-dimensional scanner Physics 2 Active
US10012590B2 Methods and systems for biological instrument calibration Physics 1 Active
US10379999B2 Duplicate bug report detection using machine learning algorithms and automated feedback incorporation Physics 1 Active
US10789149B2 Duplicate bug report detection using machine learning algorithms and automated feedback incorporation Physics 1 Active
US10197529B2 Methods and systems for variant detection Physics 1 Active
US8649982B2 Automatic threshold setting and baseline determination for real-time PCR Physics 0 Active
US10648912B2 Methods and systems for instrument validation Physics 0 Active
US11664090B2 Basecaller with dilated convolutional neural network Physics 0 Active
US10002229B2 Automatic threshold setting and baseline determination for real-time PCR Physics 0 Active
US10157391B2 Distributed telecommunication network architecture and database query for audience segmentation and analysis Physics 0 Active
US10902593B2 Methods and apparatus for extended dynamic range from single exposures in capillary electrophoresis Physics 0 Active
US10557821B2 Methods and systems for variant detection Physics 0 Active
US8036832B2 Automatic threshold setting and baseline determination for real-time PCR Physics 0 Active
US10339030B2 Duplicate bug report detection using machine learning algorithms and automated feedback incorporation General 0 Revoked
US10984888B2 Methods and systems for a digital PCR experiment designer Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.