Semiconductor structure including a first transistor at a semiconductor-on-insulator region and a second transistor at a bulk region and method for the formation thereof
US9847347B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 7, 2016 |
| Grant date | Dec 19, 2017 |
| Priority date | — |
| Expiry date | Nov 7, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D87/00
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor structure includes a substrate, a first transistor and a second transistor. The substrate includes a semiconductor-on-insulator region and a bulk region. The first transistor is provided at the semiconductor-on-insulator region and includes a first gate structure and a first channel region provided in a layer of semiconductor material over a layer of electrically insulating material. The second transistor is provided at the bulk region and includes a second gate structure and a second channel region provided in a bulk semiconductor material. A plane of an interface between the second channel region and the second gate structure is not above a plane of an interface between the bulk semiconductor material and the layer of electrically insulating material in the semiconductor-on-insulator region. A height of the second gate structure is greater than a height of the first gate structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.