System and method for patch based inspection
US9904995B2 · kind B2 · utility
2Cited by
1References
14Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 9, 2015 |
| Grant date | Feb 27, 2018 |
| Priority date | — |
| Expiry date | Apr 24, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An inspection system that may include a processor and a memory module; wherein the memory module is configured to store a first image of an area of an object and a second image of the area of the object; wherein the processor is configured to generate a synthetic image of the area of the object, and to compare the synthetic image to the second image to provide defect detection results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.