Inventor · al-Araqeeb, IL

Boaz Cohen

30Patents
2h-index
48Co-inventors
53Inventor score

Filing activity: Jul 15, 2009 → Sep 6, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US10832092B2 Method of generating a training set usable for examination of a semiconductor specimen and system thereof Physics 6 Active
US11205119B2 Method of deep learning-based examination of a semiconductor specimen and system thereof Physics 4 Active
US9904995B2 System and method for patch based inspection Physics 2 Active
US11348001B2 Method of deep learning-based examination of a semiconductor specimen and system thereof Physics 2 Active
US11138507B2 System, method and computer program product for classifying a multiplicity of items Physics 2 Active
US11151710B1 Automatic selection of algorithmic modules for examination of a specimen Physics 2 Active
US9568283B2 Enclosure protecting system and method Mechanical Engineering; Lighting; Heating 2 Active
US11199506B2 Generating a training set usable for examination of a semiconductor specimen Electricity 2 Active
US11010665B2 Method of deep learning-based examination of a semiconductor specimen and system thereof Physics 2 Active
US11568531B2 Method of deep learning-based examination of a semiconductor specimen and system thereof Physics 1 Active
US11449711B2 Machine learning-based defect detection of a specimen Physics 1 Active
US11379972B2 Detecting defects in semiconductor specimens using weak labeling Physics 1 Active
US11348224B2 Mask inspection of a semiconductor specimen Physics 1 Active
US11037286B2 Method of classifying defects in a semiconductor specimen and system thereof Physics 1 Active
US11423529B2 Determination of defect location for examination of a specimen Emerging Cross-Sectional Technologies 1 Active
US11276160B2 Determining a critical dimension variation of a pattern Physics 1 Active
US12400319B2 Defect examination on a semiconductor specimen Physics 0 Active
US11263741B2 System and methods of generating comparable regions of a lithographic mask Physics 0 Active
US11940390B2 Selecting a representative subset of potential defects to improve defect classifier training and estimation of expected defects of interest Physics 0 Active
US11756188B2 Determining a critical dimension variation of a pattern Physics 0 Active
US11360030B2 Selecting a coreset of potential defects for estimating expected defects of interest Physics 0 Active
US11983867B2 Mask inspection of a semiconductor specimen Physics 0 Active
US12361531B2 Machine learning-based classification of defects in a semiconductor specimen Physics 0 Active
US10605745B2 Guided inspection of a semiconductor wafer based on systematic defects Physics 0 Active
US9927375B2 System and method for printability based inspection Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.