General universal device interface for automatic test equipment for semiconductor testing
US9921266B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 24, 2017 |
| Grant date | Mar 20, 2018 |
| Priority date | — |
| Expiry date | Jan 24, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2834
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of the present disclosure include a modular load board or “frame” that contains a number of moveable connectors. The moveable connectors can be selectively displaced within the frame, as needed, to mate with test head pogo-pins and can be fixed in place on the frame using screws. Embodiments of the present disclosure provide multiple moveable sockets that can be positioned as needed within the frame so that a quick prototype modular load board can be designed and readily modified, if need be, without requiring hard wired traces within the PCB to connect the DUT socket to the test head interface regions. Using ribbon cables, embodiments of the present disclosure eliminate the need to have any hard wired traces within a PCB load board between the DUT socket and pogo pin interface blocks.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.