Method for manufacture of a semiconductor wafer suitable for the manufacture of an SOI substrate, and SOI substrate wafer thus obtained
US9929039B2 · kind B2 · utility
2Cited by
1References
18Claims
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Key dates
| Filing date | Mar 27, 2015 |
| Grant date | Mar 27, 2018 |
| Priority date | — |
| Expiry date | Mar 27, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/40
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor wafer suitable for fabricating an SOI substrate is provided by: producing a first layer of polycrystalline semiconductor on a top side of a semiconductor carrier; then forming an interface zone on a top side of the first layer, wherein the interface zone has a structure different from a crystal structure of the first layer; and then producing a second layer of polycrystalline semiconductor on the interface zone.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.