Semiconductor device including buried capacitive structures and a method of forming the same
US9929148B1 · kind B1 · utility
6Cited by
1References
16Claims
0Family size
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Key dates
| Filing date | Feb 22, 2017 |
| Grant date | Mar 27, 2018 |
| Priority date | — |
| Expiry date | Feb 22, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D86/201
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The present disclosure provides semiconductor devices and manufacturing techniques in which a buried capacitive structure may be provided at the level of the buried insulating layer of an SOI device, thereby providing reduced process complexity compared to conventional strategies, while still preserving superior routing capabilities above the buried capacitive structures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.