Patent · US Active

Method for producing patterns by ion implantation

US9953807B2 · kind B2 · utility

0Cited by
2References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 2, 2017
Grant dateApr 24, 2018
Priority date
Expiry dateJun 2, 2037

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P70/50
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method for forming reliefs on the surface of a substrate, including a first implantation of ions in the substrate according to a first direction; a second implantation of ions in the substrate according to a second direction that is different from the first direction; at least one of the first and second implantations is carried out through at least one mask having at least one pattern; an etching of areas of the substrate having received by implantation a dose greater than or equal to a threshold, selectively to the areas of the substrate that have not received via implantation a dose greater than said threshold; the parameters of the first and second implantations being adjusted in such a way that only areas of the substrate that have been implanted both during the first implantation and during the second implantation receive a dose greater than or equal to said threshold.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.