Input/output (I/O) line test device and method for controlling the same
US9959184B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 9, 2015 |
| Grant date | May 1, 2018 |
| Priority date | — |
| Expiry date | Jun 9, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F13/4282
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An input/output (I/O) line test device and a method for controlling the same are disclosed, which may relate to a technology for testing a base die having no cell using various patterns. The I/O line test device may include an interface controller configured to perform signal transmission/reception between a pad and an input/output line (IOL), and a signal transceiver configured to perform signal transmission/reception between the IOL and a through silicon via (TSV). The I/O line test device may include a latch unit configured to latch output data of the signal transceiver, and a test controller configured to output a control signal for controlling whether the signal transceiver performs a reception operation in response to a write enable signal and a test signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.