Devices with backside metal structures and methods of formation thereof
US9960076B2 · kind B2 · utility
1Cited by
0References
29Claims
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Assignee
Inventors
Key dates
| Filing date | Aug 5, 2016 |
| Grant date | May 1, 2018 |
| Priority date | — |
| Expiry date | Aug 5, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/8503
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method of fabricating a semiconductor device includes forming trenches filled with a sacrificial material. The trenches extend into a semiconductor substrate from a first side. An epitaxial layer is formed over the first side of the semiconductor substrate and the trenches. From a second side of the semiconductor substrate opposite to the first side, the sacrificial material in the trenches is removed. The trenches are filled with a conductive material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.