Device profiling for tuning OpenCL applications on programmable integrated circuits
US9977758B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 19, 2015 |
| Grant date | May 22, 2018 |
| Priority date | — |
| Expiry date | May 13, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2212/1024
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system may include a first region implemented in programmable circuitry of a programmable integrated circuit. The first region may include predefined interface circuitry configured to communicate with a host processor. The system may include a second region implemented in the programmable circuitry of the programmable integrated circuit. The second region may include a first hardware accelerated kernel of an OpenCL application. The system may include a first monitor circuit implemented within the first region or the second region. The first hardware accelerated kernel and the first monitor circuit may be coupled to the interface circuitry of the first region. The first monitor circuit may be operable responsive to control signals received from the host processor of a platform through the interface circuitry to store operation data for the first region or the first hardware accelerated kernel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.