Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring head
US9982994B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 5, 2017 |
| Grant date | May 29, 2018 |
| Priority date | — |
| Expiry date | May 5, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2210/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to an optical measuring process for acquiring a surface topography of a measurement object. To this end, a measuring device with a measuring head in a measuring head guide device is provided for chromatic confocal acquisition of the surface topography or for spectral interferometric OCT acquisition of the distance to the surface topography. Firstly, spectrally broadband light of a light source from a fibre array with i fibres of i measurement spots is directed onto the measurement object via a common measuring head optic, with formation of a spot array of i measurement spots. i reflection spectra of the i measurement channels are then acquired and digitized. Finally, the digitized reflection spectra are evaluated with removal of time variations of systematic measurement errors and time-related deviation movements of the measuring head guide device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.