FUJITSU AUTOMATION LIMITED
13Patents
0Active
13Granted
29Portfolio score
Filing activity: Sep 6, 1989 → Jun 25, 2001
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5747874A | Semiconductor device, base member for semiconductor device and semiconductor device unit | Electricity | 22 | Expired |
| US6022759A | Method for producing a semiconductor device, base member for semiconductor device and semiconductor device unit | Electricity | 21 | Expired |
| US5475259A | Semiconductor device and carrier for carrying semiconductor device | Electricity | 20 | Expired |
| US5744964A | Method and apparatus for electrical test of wiring patterns formed on a printed circuit board | Physics | 18 | Expired |
| US5013906A | Fish sex discrimination equipment and method | Human Necessities | 17 | Expired |
| US5666064A | Semiconductor device, carrier for carrying semiconductor device, and method of testing and producing semiconductor device | Electricity | 16 | Expired |
| US5634003A | Logic simulation apparatus based on dedicated hardware simulating a logic circuit and selectable to form a processing scale | Physics | 15 | Expired |
| US6511620B1 | Method of producing semiconductor devices having easy separability from a metal mold after molding | Electricity | 13 | Expired |
| US5750421A | Semiconductor device, carrier for carrying semiconductor device, and method of testing and producing semiconductor device | Electricity | 13 | Expired |
| US5637923A | Semiconductor device, carrier for carrying semiconductor device | Electricity | 6 | Expired |
| US5736428A | Process for manufacturing a semiconductor device having a stepped encapsulated package | Electricity | 4 | Expired |
| US5838593A | Simulation apparatus | Physics | 4 | Expired |
| US6518766B2 | Method of inspecting an electrical disconnection between circuits by calculating physical quantities thereof based on capacitances regarding the circuits measured twice | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.