International Precision Inc.
6Patents
0Active
6Granted
21Portfolio score
Filing activity: Oct 30, 1979 → Mar 28, 1983
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4426577A | Electron microscope of scanning type | Electricity | 20 | Expired |
| US4596934A | Electron beam apparatus with improved specimen holder | Electricity | 20 | Expired |
| US4316087A | Method of photographing electron microscope images on a single photographic plate and apparatus therefor | Electricity | 8 | Expired |
| US4434367A | Electron microscope | Electricity | 6 | Expired |
| US4429222A | Transmission electron microscope | Electricity | 4 | Expired |
| US4383176A | Objective lens for electron microscope | Electricity | 3 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.