NGR INC.
12Patents
11Active
12Granted
46Portfolio score
Filing activity: May 23, 2003 → Jun 28, 2018 · 3 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8045785B2 | Pattern inspection apparatus and method | Electricity | 23 | Active |
| US8422761B2 | Defect and critical dimension analysis systems and methods for a semiconductor lithographic process | Physics | 10 | Active |
| US8150140B2 | System and method for a semiconductor lithographic process control using statistical information in defect identification | Physics | 9 | Active |
| US8285031B2 | Pattern inspection apparatus and method | Physics | 7 | Active |
| US7983471B2 | Pattern inspection apparatus and method | Physics | 4 | Active |
| US9189843B2 | Pattern inspection apparatus and method | Physics | 4 | Active |
| US6925705B2 | Cage making apparatus | Emerging Cross-Sectional Technologies | 3 | Expired |
| US10446365B2 | Method of verifying operation parameter of scanning electron microscope | Electricity | 1 | Active |
| US10515779B2 | Imaging system and imaging method | Electricity | 0 | Active |
| US10354375B2 | Method of utilizing information on shape of frequency distribution of inspection result in a pattern inspection apparatus | Physics | 0 | Active |
| US10515778B2 | Secondary particle detection system of scanning electron microscope | Electricity | 0 | Active |
| US9793091B1 | Image generation apparatus | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.