Probe Technology, Inc.
9Patents
0Active
9Granted
30Portfolio score
Filing activity: Jan 14, 1993 → Apr 8, 1998
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5422574A | Large scale protrusion membrane for semiconductor devices under test with very high pin counts | Physics | 188 | Expired |
| US5742174A | Membrane for holding a probe tip in proper location | Physics | 136 | Expired |
| US5720098A | Method for making a probe preserving a uniform stress distribution under deflection | Emerging Cross-Sectional Technologies | 119 | Expired |
| US5764072A | Dual contact probe assembly for testing integrated circuits | Physics | 73 | Expired |
| US5884395A | Assembly structure for making integrated circuit chip probe cards | Emerging Cross-Sectional Technologies | 41 | Expired |
| US6064215A | High temperature probe card for testing integrated circuits | Physics | 40 | Expired |
| US6204674A | Assembly structure for making integrated circuit chip probe cards | Physics | 39 | Expired |
| US5644249A | Method and circuit testing apparatus for equalizing a contact force between probes and pads | Physics | 34 | Expired |
| US5751157A | Method and apparatus for aligning probes | Physics | 30 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.