SNU PRECISION CO., LTD.
14Patents
10Active
14Granted
44Portfolio score
Filing activity: May 30, 1997 → Mar 17, 2014 · 5 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6167634A | Measurement and compensation system for thermal errors in machine tools | Physics | 24 | Expired |
| US5841668A | Method of assessing three dimensional volumetric errors in multiaxis machine tools | Physics | 23 | Expired |
| US8873067B2 | Interferometer for TSV measurement and measurement method using same | Electricity | 19 | Active |
| US8223326B2 | Dark-field examination device | Physics | 14 | Active |
| US6269544A | Apparatus for measuring three-dimensional volumetric errors in multiaxis machine tool | Physics | 13 | Expired |
| US8279447B2 | Method for measuring thickness | Physics | 2 | Active |
| US7308130B2 | Method for inspecting input shaft of power steering system | Physics | 2 | Expired |
| US8199332B2 | Apparatus for measuring thickness | Physics | 2 | Active |
| US8947673B2 | Estimating thickness based on number of peaks between two peaks in scanning white light interferometry | Physics | 1 | Active |
| US9148549B2 | Image processing method and image processing apparatus using time axis low band pass filter | Physics | 0 | Active |
| US8416293B2 | Plasma monitoring device and method | Electricity | 0 | Active |
| US9696144B2 | Three-dimensional shape measuring device capable of measuring color information | Physics | 0 | Active |
| US9046716B2 | Device for supporting substrate and examiner for seal pattern of LCD cell using the same | Performing Operations; Transporting | 0 | Active |
| US8116555B2 | Vision inspection system and method for inspecting workpiece using the same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.