TASMIT, INC.
9Patents
9Active
9Granted
43Portfolio score
Filing activity: Jun 20, 2018 → Apr 9, 2021
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10614999B2 | Image generation method | Electricity | 2 | Active |
| US11380513B2 | Autofocus method for a scanning electron microscope | Electricity | 2 | Active |
| US10802073B2 | Pattern defect detection method | Physics | 2 | Active |
| US12243237B2 | Pattern-edge detection method, pattern-edge detection apparatus, and storage medium storing program for causing a computer to perform pattern-edge detection | Physics | 0 | Active |
| US12347642B2 | Scanning electron microscope | Electricity | 0 | Active |
| US11468555B2 | Method and apparatus for generating a correction line indicating relationship between deviation of an edge of a wafer pattern from an edge of a reference pattern and space width of the reference pattern, and a computer-readable recording medium | Physics | 0 | Active |
| US11436736B2 | Pattern edge detection method | Physics | 0 | Active |
| US12387341B2 | Pattern matching method | Electricity | 0 | Active |
| US11322332B2 | Apparatus and method for measuring energy spectrum of backscattered electrons | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.