Aaron S. Wallack
75Patents
26h-index
42Co-inventors
88Inventor score
Filing activity: Apr 28, 1995 → May 18, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5768443A | Method for coordinating multiple fields of view in multi-camera | Physics | 277 | Expired |
| US6681151B1 | System and method for servoing robots based upon workpieces with fiducial marks using machine vision | Physics | 182 | Expired |
| US6728582B1 | System and method for determining the position of an object in three dimensions using a machine vision system with two cameras | Emerging Cross-Sectional Technologies | 128 | Expired |
| US6173070A | Machine vision method using search models to find features in three dimensional images | Physics | 123 | Expired |
| US6408109B1 | Apparatus and method for detecting and sub-pixel location of edges in a digital image | Physics | 118 | Expired |
| US6137893A | Machine vision calibration targets and methods of determining their location and orientation in an image | Physics | 101 | Expired |
| US5960125A | Nonfeedback-based machine vision method for determining a calibration relationship between a camera and a moveable object | Physics | 95 | Expired |
| US6751338B1 | System and method of using range image data with machine vision tools | Physics | 80 | Expired |
| US6539107B1 | Machine vision method using search models to find features in three-dimensional images | Physics | 70 | Expired |
| US6658145B1 | Fast high-accuracy multi-dimensional pattern inspection | Physics | 69 | Expired |
| US9734419B1 | System and method for validating camera calibration in a vision system | Physics | 65 | Active |
| US6771808B1 | System and method for registering patterns transformed in six degrees of freedom using machine vision | Physics | 65 | Expired |
| US8111904B2 | Methods and apparatus for practical 3D vision system | Physics | 58 | Active |
| US5978521A | Machine vision methods using feedback to determine calibration locations of multiple cameras that image a common object | Physics | 57 | Expired |
| US5825483A | Multiple field of view calibration plate having a reqular array of features for use in semiconductor manufacturing | Physics | 53 | Expired |
| US6690842B1 | Apparatus and method for detection and sub-pixel location of edges in a digital image | Physics | 47 | Expired |
| US6850646B1 | Fast high-accuracy multi-dimensional pattern inspection | Physics | 47 | Expired |
| US6748104B1 | Methods and apparatus for machine vision inspection using single and multiple templates or patterns | Physics | 43 | Expired |
| US8442304B2 | System and method for three-dimensional alignment of objects using machine vision | Physics | 41 | Active |
| US6856698B1 | Fast high-accuracy multi-dimensional pattern localization | Physics | 40 | Expired |
| US8126260B2 | System and method for locating a three-dimensional object using machine vision | Physics | 33 | Active |
| US5978081A | Multiple field of view calibration plate for use in semiconductor manufacturing | Physics | 31 | Expired |
| US6219461A | Determining a depth | Physics | 30 | Expired |
| US6269197A | Determining a depth | Physics | 29 | Expired |
| US6931602B1 | Approach facilitating the selection of various machine vision functionality from among different platforms | Emerging Cross-Sectional Technologies | 26 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.