Adam Baer
6Patents
2h-index
11Co-inventors
44Inventor score
Filing activity: Jul 29, 2004 → Dec 4, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7239389B2 | Determination of irradiation parameters for inspection of a surface | Physics | 8 | Expired |
| US8207504B2 | Inspection of EUV masks by a DUV mask inspection tool | Physics | 7 | Active |
| US7315364B2 | System for inspecting a surface employing configurable multi angle illumination modes | Physics | 2 | Expired |
| US8488117B2 | Inspection system and method for fast changes of focus | Physics | 2 | Active |
| US8659754B2 | Inspection system and method for fast changes of focus | Physics | 1 | Active |
| US9395266B2 | On-tool wavefront aberrations measurement system and method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.