Inspection system and method for fast changes of focus
US8488117B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 1, 2011 |
| Grant date | Jul 16, 2013 |
| Priority date | — |
| Expiry date | Sep 17, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/294
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system includes a first focusing unit configured to perform fast focus changes to a first focusing function applied to an incident light beam. A traveling lens acousto-optic device is arranged to receive the light beam focused by the first focusing function and produce focused spots using a plurality of traveling lenses generated in response to radio frequency signals. The traveling lenses apply a second focusing function and the traveling lens acousto-optic device is arranged to alter the second focusing function at a fast rate. The inspection system also includes optics arranged to direct the focused spots onto an inspected object and to direct radiation from the inspected object to a sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.