Adolfo Anciso
4Patents
1h-index
4Co-inventors
30Inventor score
Filing activity: Aug 2, 2001 → Jan 4, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6927174B2 | Site-specific method for large area uniform thickness plan view transmission electron microscopy sample preparation | Physics | 2 | Expired |
| US6786978B2 | Mass production of cross-section TEM samples by focused ion beam deposition and anisotropic etching | Electricity | 1 | Expired |
| US6884362B2 | Mass production of cross-section TEM samples by focused ion beam deposition and anisotropic etching | Electricity | 1 | Expired |
| US7262409B2 | Chemical etch solution and technique for imaging a device's shallow junction profile | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.