An-Ru Cheng
5Patents
1h-index
7Co-inventors
33Inventor score
Filing activity: Mar 28, 2003 → Jan 30, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6806142B1 | Method for coding semiconductor permanent store ROM | Electricity | 1 | Expired |
| US7036099B2 | Integrated circuit capable of locating failure process layers | Physics | 1 | Expired |
| US6756275B1 | Method for minimizing product turn-around time for making semiconductor permanent store ROM cell | Electricity | 1 | Expired |
| US7089137B2 | Universal test platform and test method for latch-up | Physics | 1 | Expired |
| US7464357B2 | Integrated circuit capable of locating failure process layers | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.