Andy Ray
8Patents
2h-index
9Co-inventors
40Inventor score
Filing activity: Jun 8, 2010 → Feb 14, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8502173B2 | System and method for ion implantation with improved productivity and uniformity | Electricity | 13 | Active |
| US8278634B2 | System and method for ion implantation with improved productivity and uniformity | Electricity | 10 | Active |
| US11646175B2 | Method of mixing upstream and downstream current measurements for inference of the beam current at the bend of an optical element for realtime dose control | Electricity | 2 | Active |
| US10483086B2 | Beam profiling speed enhancement for scanned beam implanters | Electricity | 1 | Active |
| US8378313B2 | Uniformity of a scanned ion beam | Electricity | 0 | Active |
| US9147554B2 | Use of beam scanning to improve uniformity and productivity of a 2D mechanical scan implantation system | Electricity | 0 | Active |
| US9490185B2 | Implant-induced damage control in ion implantation | Electricity | 0 | Active |
| US9711329B2 | System and method to improve productivity of hybrid scan ion beam implanters | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.