Avi Golan
8Patents
4h-index
12Co-inventors
50Inventor score
Filing activity: Jul 6, 2005 → Sep 22, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7969174B2 | Systems and methods for test time outlier detection and correction in integrated circuit testing | Physics | 9 | Active |
| US7208969B2 | Optimize parallel testing | Physics | 7 | Expired |
| US8285752B1 | System and method for maintaining a plurality of summary levels in a single table | Physics | 6 | Active |
| US7528622B2 | Methods for slow test time detection of an integrated circuit during parallel testing | Physics | 4 | Active |
| US8421494B2 | Systems and methods for test time outlier detection and correction in integrated circuit testing | Physics | 2 | Active |
| US9529036B2 | Systems and methods for test time outlier detection and correction in integrated circuit testing | Physics | 2 | Active |
| US8872538B2 | Systems and methods for test time outlier detection and correction in integrated circuit testing | Physics | 0 | Active |
| US8945632B2 | Methods and compositions for inhibiting the nuclear factor κB pathway | Human Necessities | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.