Bart Laenens
4Patents
1h-index
6Co-inventors
30Inventor score
Filing activity: Jul 9, 2014 → Apr 5, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10663870B2 | Gauge pattern selection | Physics | 1 | Active |
| US11415899B2 | Method of determining a focus of a projection system, device manufacturing method, and apparatus for determining a focus of a projection system | Physics | 0 | Active |
| US10884333B2 | Method of designing lithography features by self-assembly of block copolymer | Performing Operations; Transporting | 0 | Active |
| US10339260B2 | Methodology to generate guiding templates for directed self-assembly | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.