Bas Hulsken
15Patents
2h-index
19Co-inventors
43Inventor score
Filing activity: Dec 10, 2009 → Mar 16, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8995790B2 | Image processing method in microscopy | Physics | 5 | Active |
| US10353190B2 | Sensor for microscopy | Physics | 3 | Active |
| US10061108B2 | Autofocus imaging for a microscope | Electricity | 2 | Active |
| US9578227B2 | Determining a polar error signal of a focus position of an autofocus imaging system | Electricity | 2 | Active |
| US10082663B2 | Method for simultaneous capture of image data at multiple depths of a sample | Electricity | 1 | Active |
| US9128016B2 | Up-concentration of organic microobjects for microscopic imaging | Physics | 1 | Active |
| US10371929B2 | Autofocus imaging | Electricity | 1 | Active |
| US10867443B2 | Information transformation in digital pathology | Physics | 0 | Active |
| US10623627B2 | System for generating a synthetic 2D image with an enhanced depth of field of a biological sample | Physics | 0 | Active |
| US10365468B2 | Autofocus imaging | Electricity | 0 | Active |
| US10091445B2 | Scanning imaging system with a novel imaging sensor with gaps for electronic circuitry | Electricity | 0 | Active |
| US10917663B2 | Method and apparatus for fast and efficient image compression and decompression | Electricity | 0 | Active |
| US9910258B2 | Method for simultaneous capture of image data at multiple depths of a sample | Electricity | 0 | Active |
| US9832365B2 | Autofocus based on differential measurements | Electricity | 0 | Active |
| US9684159B2 | Scanning microscope | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.