Benjamin Kaczer
4Patents
1h-index
8Co-inventors
37Inventor score
Filing activity: Oct 12, 2010 → Nov 19, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10469083B2 | Breakdown-based physical unclonable function | Electricity | 3 | Active |
| US8062962B2 | Method for enhancing the reliability of a P-channel semiconductor device and a P-channel semiconductor device made thereof | Electricity | 1 | Active |
| US11282837B2 | PMOS transistor including low thermal-budget gate stack | Electricity | 0 | Active |
| US11704462B2 | Complexity-reduced simulation of circuit reliability | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.