Inventor · Rochester, NY, US

Brian E. Kruschwitz

20Patents
14h-index
15Co-inventors
70Inventor score

Filing activity: Dec 18, 1998 → Dec 15, 2004

Most-cited inventions

PatentTitleAreaCited byStatus
US6594090B2 Laser projection display system Electricity 487 Expired
US6577429B1 Laser projection display system Physics 278 Expired
US6144481A Method and system for actuating electro-mechanical ribbon elements in accordance to a data stream Electricity 102 Expired
US6335831B2 Multilevel mechanical grating device Physics 101 Expired
US6038057A Method and system for actuating electro-mechanical ribbon elements in accordance to a data stream Physics 81 Expired
US6947459B2 Organic vertical cavity laser and imaging system Electricity 66 Expired
US6181458A Mechanical grating device with optical coating and method of making mechanical grating device with optical coating Physics 61 Expired
US6172796A Multilevel electro-mechanical grating device and a method for operating a multilevel mechanical and electro-mechanical grating device Physics 60 Expired
US6252697A Mechanical grating device Physics 52 Expired
US6479811B1 Method and system for calibrating a diffractive grating modulator Physics 47 Expired
US6950454B2 Electronic imaging system using organic laser array illuminating an area light valve Electricity 38 Expired
US6233087A Electro-mechanical grating device Physics 28 Expired
US6621615B2 Method and system for image display Electricity 21 Expired
US7119936B2 Speckle reduction for display system with electromechanical grating Physics 17 Expired
US7046446B1 Speckle reduction for display system with electromechanical grating Electricity 14 Expired
US6243194A Electro-mechanical grating device Physics 13 Expired
US7065115B2 External cavity organic laser Electricity 7 Expired
US6970488B2 Tunable organic VCSEL system Electricity 4 Expired
US6750998B2 Electro-mechanical grating device having a continuously controllable diffraction efficiency Physics 2 Expired
US6710329B1 Light integrator for film scanning with enhanced suppression of artifacts due to scratches and debris Physics 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.