Chaim Braude
4Patents
2h-index
14Co-inventors
37Inventor score
Filing activity: Oct 30, 2006 → Nov 19, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8207504B2 | Inspection of EUV masks by a DUV mask inspection tool | Physics | 7 | Active |
| US7330249B2 | Qualification of a mask | Electricity | 3 | Active |
| US8098926B2 | Method and system for evaluating an evaluated pattern of a mask | Physics | 1 | Active |
| US8213024B2 | Method and system for aerial imaging of a reticle | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.