Cheng-Hung Wang
10Patents
1h-index
17Co-inventors
47Inventor score
Filing activity: Jan 17, 2013 → May 12, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11031320B2 | Structures and methods for reducing process charging damages | Electricity | 2 | Active |
| US11688666B2 | Structures and methods for reducing process charging damages | Electricity | 1 | Active |
| US11508628B2 | Method for forming a crystalline protective polysilicon layer | Electricity | 1 | Active |
| US9564376B2 | Semiconductor process | Electricity | 1 | Active |
| US11894381B2 | Structures and methods for trench isolation | Electricity | 0 | Active |
| US12068227B2 | Structures and methods for reducing process charging damages | Electricity | 0 | Active |
| US10395997B2 | Semiconductor process | Electricity | 0 | Active |
| US11935795B2 | Method for forming a crystalline protective polysilicon layer | Electricity | 0 | Active |
| US9101057B2 | Micro secure digital adapter | Electricity | 0 | Active |
| US12074169B2 | Structures and methods for trench isolation | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.