Christopher D. Wait
3Patents
3h-index
4Co-inventors
36Inventor score
Filing activity: Jul 2, 1997 → Mar 17, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5764655A | Built in self test with memory | Physics | 111 | Expired |
| US6346979B1 | Process and apparatus to adjust exposure dose in lithography systems | Physics | 34 | Expired |
| US6185712A | Chip performance optimization with self programmed built in self test | Physics | 30 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.