Christopher Voges
4Patents
1h-index
8Co-inventors
33Inventor score
Filing activity: Sep 8, 2009 → Jun 8, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8426223B2 | Wafer edge inspection | Physics | 7 | Active |
| US9062859B2 | Wafer edge inspection illumination system | Physics | 1 | Active |
| US9594230B2 | On-axis focus sensor and method | Physics | 0 | Active |
| US11578967B2 | Wafer inspection system including a laser triangulation sensor | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.