Chun-Hung Ko
9Patents
2h-index
11Co-inventors
44Inventor score
Filing activity: Oct 27, 2003 → Feb 12, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7532317B2 | Scatterometry method with characteristic signatures matching | Electricity | 11 | Active |
| US8735258B2 | Integrated circuit resistor fabrication with dummy gate removal | Electricity | 3 | Active |
| US6995902B2 | Microscopic imaging apparatus with flat-top distribution of light | Physics | 2 | Expired |
| US8877614B2 | Spacer for semiconductor structure contact | Electricity | 2 | Active |
| US7800824B2 | Method for designing gratings | Emerging Cross-Sectional Technologies | 1 | Active |
| US8835242B2 | Semiconductor structure and method | Electricity | 1 | Active |
| US7610170B2 | Method for enhancing the measurement capability of multi-parameter inspection systems | Physics | 1 | Active |
| US8692353B2 | Semiconductor structure and method | Electricity | 0 | Active |
| US7355713B2 | Method for inspecting a grating biochip | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.