Curt H. Chadwick
18Patents
12h-index
58Co-inventors
81Inventor score
Filing activity: Dec 15, 1975 → Jun 27, 1997
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5502306A | Electron beam inspection system and method | Electricity | 259 | Expired |
| US4877326A | Method and apparatus for optical inspection of substrates | Physics | 185 | Expired |
| US4618938A | Method and apparatus for automatic wafer inspection | Physics | 167 | Expired |
| US4556317A | X-Y Stage for a patterned wafer automatic inspection system | Physics | 86 | Expired |
| US5131755A | Automatic high speed optical inspection system | Physics | 61 | Expired |
| US4639587A | Automatic focusing system for a microscope | Physics | 54 | Expired |
| US6141038A | Alignment correction prior to image sampling in inspection systems | Physics | 53 | Expired |
| US5085517A | Automatic high speed optical inspection system | Physics | 43 | Expired |
| US4023891A | Adjustable mirror mount assembly | Physics | 20 | Expired |
| US4647764A | Rotational and focusing apparatus for turret mounted lenses | Physics | 15 | Expired |
| US4604910A | Apparatus for accurately positioning an object at each of two locations | Emerging Cross-Sectional Technologies | 13 | Expired |
| USRE37740E1 | Method and apparatus for optical inspection of substrates | General | 12 | Expired |
| US4199735A | Optical compensation for thermal lensing in conductively cooled laser rod | Electricity | 6 | Expired |
| US4170763A | Conductively cooled laser pumping assembly | Electricity | 3 | Expired |
| US4181900A | Laser pumping assembly | Electricity | 3 | Expired |
| US4889676A | Method of molding a precision surface on an instrument table | Performing Operations; Transporting | 2 | Expired |
| US5014627A | Stable instrument bench with replicated precision surface | Performing Operations; Transporting | 1 | Expired |
| US4183483A | Translating mechanism | Emerging Cross-Sectional Technologies | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.