Curtis Lapadat
4Patents
3h-index
11Co-inventors
43Inventor score
Filing activity: Mar 4, 1996 → Feb 12, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5835501A | Built-in test scheme for a jitter tolerance test of a clock and data recovery unit | Electricity | 44 | Expired |
| US6510076B1 | Variable read/write margin high-performance soft-error tolerant SRAM bit cell | Physics | 36 | Expired |
| US5850153A | Tristatable output driver for use with 3.3 or 5 volt CMOS logic | Electricity | 7 | Expired |
| US6185713A | Method and apparatus for improving stuck-at fault detection in large scale integrated circuit testing | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.