Daniel Bui
4Patents
2h-index
12Co-inventors
45Inventor score
Filing activity: Jul 25, 1994 → May 15, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6252705A | Stage for charged particle microscopy system | Electricity | 26 | Expired |
| US5517033A | Apparatus for improved image resolution in electron microscopy | Electricity | 20 | Expired |
| US9934933B1 | Extractor electrode for electron source | Electricity | 1 | Active |
| US10340114B1 | Method of eliminating thermally induced beam drift in an electron beam separator | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.