Daniel Rodier
15Patents
9h-index
14Co-inventors
69Inventor score
Filing activity: Jun 24, 2002 → Jun 14, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7208123B2 | Molecular contamination monitoring system and method | Emerging Cross-Sectional Technologies | 64 | Expired |
| US7235214B2 | System and method for measuring molecular analytes in a measurement fluid | Emerging Cross-Sectional Technologies | 53 | Expired |
| US6945090B2 | Method and apparatus for monitoring molecular contamination of critical surfaces using coated SAWS | Physics | 50 | Expired |
| US9808760B2 | Active filtration system for controlling cleanroom environments | Performing Operations; Transporting | 28 | Active |
| US9682345B2 | Method of treating a cleanroom enclosure | Performing Operations; Transporting | 27 | Active |
| US10928293B2 | Detecting nanoparticles on production equipment and surfaces | Physics | 22 | Active |
| US10908059B2 | Slurry monitor coupling bulk size distribution and single particle detection | Physics | 19 | Active |
| US11237095B2 | Particle detection systems and methods for on-axis particle detection and/or differential detection | Physics | 14 | Active |
| US11268930B2 | Triggered sampling systems and methods | Physics | 10 | Active |
| US11428617B2 | Slurry monitor coupling bulk size distribution and single particle detection | Physics | 8 | Active |
| US11428619B2 | Detecting nanoparticles on production equipment and surfaces | Physics | 6 | Active |
| US11988593B2 | Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions | Physics | 4 | Active |
| US11946852B2 | Particle detection systems and methods for on-axis particle detection and/or differential detection | Physics | 3 | Active |
| US12276592B2 | Particle detection via scattered light combined with incident light | Physics | 1 | Active |
| US12399114B2 | Modular particle counter with docking station | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.