Daryl L. Habersetzer
40Patents
11h-index
12Co-inventors
64Inventor score
Filing activity: Jul 6, 1995 → Jun 30, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5677567A | Leads between chips assembly | Electricity | 55 | Expired |
| US5627478A | Apparatus for disabling and re-enabling access to IC test functions | Physics | 36 | Expired |
| US6834022B2 | Partial array self-refresh | Physics | 36 | Expired |
| US6130834A | Circuit for programming antifuse bits | Physics | 28 | Expired |
| US5894165A | Leads between chips assembly | Electricity | 26 | Expired |
| US5808897A | Integrated circuit device having interchangeable terminal connection | Electricity | 23 | Expired |
| US5770480A | Method of leads between chips assembly | Electricity | 20 | Expired |
| US5689455A | Circuit for programming antifuse bits | Physics | 18 | Expired |
| US6055173A | Circuit for programming antifuse bits | Physics | 14 | Expired |
| US5721703A | Reprogrammable option select circuit | Physics | 14 | Expired |
| US6028799A | Memory circuit voltage regulator | Physics | 14 | Expired |
| US6826071B2 | Circuit for programming antifuse bits | Physics | 10 | Expired |
| US6445605B1 | Circuit for programming antifuse bits | Physics | 10 | Expired |
| US5877993A | Memory circuit voltage regulator | Physics | 9 | Expired |
| US6650587B2 | Partial array self-refresh | Physics | 9 | Expired |
| US6903991B2 | Circuit for programming antifuse bits | Physics | 9 | Expired |
| US6255837A | Apparatus and method disabling and re-enabling access to IC test functions | Physics | 9 | Expired |
| US6160413A | Apparatus and method for disabling and re-enabling access to IC test functions | Physics | 8 | Expired |
| US6661693B2 | Circuit for programming antifuse bits | Physics | 7 | Expired |
| US6335888B2 | Margin-range apparatus for a sense amp's voltage-pulling transistor | Physics | 6 | Expired |
| US6570400B2 | Method for disabling and re-enabling access to IC test functions | Physics | 5 | Expired |
| US6052322A | Memory circuit voltage regulator | Physics | 5 | Expired |
| US6255838A | Apparatus and method for disabling and re-enabling access to IC test functions | Physics | 5 | Expired |
| US6778452B2 | Circuit and method for voltage regulation in a semiconductor device | Physics | 4 | Expired |
| US6011731A | Cell plate regulator | Physics | 4 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.