David Beyeler
4Patents
1h-index
8Co-inventors
33Inventor score
Filing activity: Oct 17, 2014 → Jan 7, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9575093B2 | System for the combined, probe-based mechanical and electrical testing of MEMS | Physics | 1 | Active |
| US11435378B2 | MEMS-based nanoindentation force sensor with electro-thermal tip heating | Physics | 1 | Active |
| US11307125B2 | MEMS nanoindenter chip with indenter probe and reference probe | Physics | 0 | Active |
| US10691080B2 | Computerised system | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.