David Foord
4Patents
1h-index
7Co-inventors
30Inventor score
Filing activity: Jun 17, 2013 → Jul 17, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8766214B2 | Method of preparing and imaging a lamella in a particle-optical apparatus | Electricity | 3 | Active |
| US9618460B2 | Method of performing tomographic imaging of a sample in a charged-particle microscope | Electricity | 0 | Active |
| US9514913B2 | TEM sample mounting geometry | Electricity | 0 | Active |
| US10325754B2 | Ion implantation to alter etch rate | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.