David J. Heine
7Patents
5h-index
17Co-inventors
56Inventor score
Filing activity: Dec 23, 1996 → Apr 1, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5804249A | Multistep tungsten CVD process with amorphization step | Electricity | 88 | Expired |
| US7904278B2 | Methods and system for program execution integrity measurement | Physics | 21 | Active |
| US6066561A | Apparatus and method for electrical determination of delamination at one or more interfaces within a semiconductor wafer | Electricity | 20 | Expired |
| US5769692A | On the use of non-spherical carriers for substrate chemi-mechanical polishing | Performing Operations; Transporting | 15 | Expired |
| US6016009A | Integrated circuit with tungsten plug containing amorphization layer | Electricity | 5 | Expired |
| US9507945B2 | Method and apparatus for automated vulnerability detection | Physics | 4 | Active |
| US8326579B2 | Method and system for program execution integrity measurement | Physics | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.