David L. Johnson
18Patents
10h-index
30Co-inventors
72Inventor score
Filing activity: Mar 21, 1977 → Feb 14, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6864710B1 | Programmable logic device | Electricity | 106 | Expired |
| US6388464B1 | Configurable memory for programmable logic circuits | Electricity | 61 | Expired |
| US6512395B1 | Configurable memory for programmable logic circuits | Electricity | 55 | Expired |
| US6308245A | Adaptive, time-based synchronization mechanism for an integrated posix file system | Emerging Cross-Sectional Technologies | 54 | Expired |
| US6384628B1 | Multiple voltage supply programmable logic device | Electricity | 42 | Expired |
| US6608500B1 | I/O architecture/cell design for programmable logic device | Electricity | 18 | Expired |
| US5996091A | CPLD serial programming with extra read register | Physics | 17 | Expired |
| US4099324A | Mechanism for feeding and inserting pins into circuit board | Emerging Cross-Sectional Technologies | 14 | Expired |
| US7181588B2 | Computer apparatus and method for autonomic adjustment of block transfer size | Physics | 11 | Expired |
| US7483956B2 | E-mail to physical mail converter | Electricity | 11 | Active |
| US4788670A | Clock voltage supply | Physics | 10 | Expired |
| US5367674A | Data stream optimizer utilizing difference coding between a current state buffer and a next state buffer | Physics | 9 | Expired |
| US5805794A | CPLD serial programming with extra read register | Physics | 8 | Expired |
| US4442697A | Pre-stressed impact testing device | Physics | 7 | Expired |
| US4800532A | Circuit arrangement with a processor and at least two read-write memories | Physics | 4 | Expired |
| US11238231B2 | Data relationships in a question-answering environment | Physics | 0 | Active |
| US10289679B2 | Data relationships in a question-answering environment | Physics | 0 | Active |
| US8788322B2 | Integration of WIC items and transactions into personal shopping devices | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.