Dawei Hu
17Patents
3h-index
57Co-inventors
59Inventor score
Filing activity: Jan 18, 2007 → Jul 1, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9657236B2 | Process for hydrotreating heavy raw oils | Chemistry; Metallurgy | 25 | Active |
| US9595481B1 | Dispersion model for band gap tracking | Physics | 6 | Active |
| US11156548B2 | Measurement methodology of advanced nanostructures | Physics | 5 | Active |
| US11573077B2 | Scatterometry based methods and systems for measurement of strain in semiconductor structures | Physics | 3 | Active |
| US10684203B2 | Ring shear and seepage-coupled apparatus and ring shear and seepage-coupled test system for rock and rock fracture under tension or compression stress | Emerging Cross-Sectional Technologies | 3 | Active |
| US7704339B2 | Method of heat treating titanium aluminide | Chemistry; Metallurgy | 2 | Active |
| US10012577B2 | Rock hollow cylinder torsional shear apparatus | Physics | 2 | Active |
| US11378451B2 | Bandgap measurements of patterned film stacks using spectroscopic metrology | Physics | 1 | Active |
| US11060846B2 | Scatterometry based methods and systems for measurement of strain in semiconductor structures | Physics | 0 | Active |
| US10410935B1 | Dispersion model for band gap tracking | Physics | 0 | Active |
| US11231362B1 | Multi-environment polarized infrared reflectometer for semiconductor metrology | Physics | 0 | Active |
| US11796390B2 | Bandgap measurements of patterned film stacks using spectroscopic metrology | Physics | 0 | Active |
| US11060982B2 | Multi-dimensional model of optical dispersion | Physics | 0 | Active |
| US10770362B1 | Dispersion model for band gap tracking | Physics | 0 | Active |
| US11486249B2 | Combined rock-breaking TBM tunneling method in complex strata for realizing three-way force detection | Fixed Constructions | 0 | Active |
| US11415498B2 | Rock high-stress high-temperature micro-nano indentation test system | Physics | 0 | Active |
| US12331256B2 | Process and system for processing aromatics-rich fraction oil | Chemistry; Metallurgy | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.